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Standard Detayı
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TÜRK STANDARDI
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TS No :
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TS EN ISO 9220
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Kabul Tarihi :
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2.03.2022
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Hazırlık Grubu :
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Teknik Kurul |
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Doküman Tipi :
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Yürürlük Durumu :
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U (Yürürlükteki Standard/Standard) |
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Başlık :
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Metalik kaplamalar - Kaplamanın ölçümü - Tarayıcı elektron mikroskobu metodu |
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Başlık (İng) :
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Metallic coatings - Measurement of coating thickness - Scanning electron microscope method |
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Kapsam :
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Kapsam (İng) :
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This document specifies a destructive method for the measurement of the local thickness of metallic
and other inorganic coatings by examination of cross-sections with a scanning electron microscope
(SEM). The method is applicable for thicknesses up to several millimetres, but for such thick coatings it
is usually more practical to use a light microscope (see ISO 1463). The lower thickness limit depends on
the achieved measurement uncertainty (see Clause 10).
NOTE The method can also be used for organic layers when they are neither damaged by the preparation of
the cross-section nor by the electron beam during imaging. |
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Yerini Aldığı :
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TS EN ISO 9220 :2001; |
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Yararlanılan Kaynak :
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EN ISO 9220:2022 |
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Uluslararası Karşılıklar :
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EN ISO 9220-EQV; ISO 9220-EQV |
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ICS Kodu :
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25.220.40 Metalik Kaplamalar |
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Cen/Cenelec :
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CEN/ISO |
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Dili :
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en |
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Renk Durumu :
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Siyah-Beyaz |
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Uygulama Durumu :
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Yürürlükte |
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Sayfa Sayısı :
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24 |
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Fiyatı :
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64,00 EURO (2.218,86 TL + %10 Kdv) |
| Çakışan Standart Varsa İptal Tarihi (DOW) | - |
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